A new system to consider varying section thickness in histophotometry

The reference material, an exposed and developed x-ray film, was cutted together with the tissue specimen. By scanning microscope photometry, the mean optical density of the silver layer was measured. By this way, variations in section thickness are to be considered for histophotometrical investigations. A good proportionality between the optical density of the silver grain layer and the relative thickness of the clear film carrier, estimated by microinterferometry, was proved.