Related Experiment Video
Updated: May 7, 2026

Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging
Published on: November 25, 2009
Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental
Christoph Huber1, Andreas Trügler, Ulrich Hohenester
1Department of Physical Chemistry, University of Vienna, Währinger Strasse 42, A-1090 Vienna, Austria. wolfgang.kautek@univie.ac.at.
Abstract:
A systematic study of the influence of the excitation angle, the light polarization and the coating thickness of commercial SPM tips on the field enhancement in an apertureless scanning near-field optical microscope is presented. A new method to optimize the alignment of the electric field vector along the major tip axis by measuring the resonance frequency was developed. The simulations were performed with a MNPBEM toolbox based on the Boundary Element Method (BEM). The influence of the coating thickness was investigated for the first time. Coatings below 40 nm showed a drastic influence both on the resonance wavelength and the enhancement. A shift to higher angles of incidence for the maximum enhancement could be observed for greater tip radii.
Related Concept Videos
Overview of Microscopy Techniques
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

