Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.1K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.1K
Three-Dimensional Microscopy in Microbiology01:28

Three-Dimensional Microscopy in Microbiology

919
Three-dimensional imaging techniques are essential in cell biology, allowing researchers to visualize intricate cellular structures with high resolution. Two prominent methods, Differential Interference Contrast Microscopy (DIC) and Confocal Scanning Laser Microscopy (CSLM), provide distinct advantages for imaging live and thick specimens, respectively.Differential Interference Contrast MicroscopyDIC microscopy enhances contrast in transparent, unstained samples by converting phase...
919

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

On-surface radical ring-opening polymerization produces ultralong poly(para-phenylene) for access to non-benzenoid carbon nanoribbons.

Nature chemistry·2026
Same author

AI-Powered Thermal Fingerprinting: Predicting PLA Tensile Strength Through Schlieren Imaging.

Polymers·2026
Same author

Probing weak chemical interactions of metal surface atoms with CO-terminated AFM tips identifies molecular adsorption sites.

Nature communications·2025
Same author

Recent Advances in PEEK for Biomedical Applications: A Comprehensive Review of Material Properties, Processing, and Additive Manufacturing.

Polymers·2025
Same author

Post-Processing PEEK 3D-Printed Parts: Experimental Investigation of Annealing on Microscale and Macroscale Properties.

Polymers·2025
Same author

Low temperature multimode atomic force microscopy using an active MEMS cantilever.

Nanoscale·2025

Related Experiment Video

Updated: May 6, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

20.8K

Visualizing the subsurface of soft matter: simultaneous topographical imaging, depth modulation, and compositional

Daniel Ebeling1, Babak Eslami, Santiago De Jesus Solares

  • 1Department of Mechanical Engineering, University of Maryland , College Park, Maryland 20742, United States.

ACS Nano
|October 18, 2013
PubMed
Summary

This study introduces a new atomic force microscopy (AFM) method using multiple probe vibrations to image buried nanoparticles in polymer films. This technique allows for controlled subsurface imaging with nanoscale precision.

More Related Videos

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.3K
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

2.5K

Related Experiment Videos

Last Updated: May 6, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

20.8K
Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.3K
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
05:04

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

2.5K

Area of Science:

  • Soft matter physics
  • Materials science
  • Nanotechnology

Background:

  • Characterizing subsurface morphology and mechanical properties at the nanoscale with depth control is crucial for soft matter applications.
  • Existing imaging tools have limitations in controllably probing buried structures.

Purpose of the Study:

  • To develop a novel trimodal atomic force microscopy (AFM) imaging scheme.
  • To enable simultaneous measurement of topography, controlled indentation, and compositional contrast for subsurface analysis.

Main Methods:

  • Utilizing three eigenmodes of a microcantilever probe as independent control parameters.
  • Implementing multifrequency imaging through computational simulation and experimental validation.
  • Applying the technique to ultrathin polymer films with embedded glass nanoparticles.

Main Results:

  • Demonstrated the ability to actively modulate tip-sample indentation using higher cantilever eigenmodes.
  • Successfully revealed glass nanoparticles buried tens of nanometers beneath the surface.
  • Maintained the capability to refocus on the surface while probing subsurface features.

Conclusions:

  • The proposed trimodal AFM imaging scheme offers a powerful new approach for subsurface characterization.
  • This method provides controllable depth profiling and compositional mapping of buried nanostructures.
  • The technique has significant potential for applications in nanotechnology and soft matter science.