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Updated: May 6, 2026

High Resolution Physical Characterization of Single Metallic Nanoparticles
Published on: June 28, 2019
C-K Liang1, S V Verkhoturov, Y Bisrat
1Department of Chemistry, Texas A&M University, College Station, TX, 77843-3255, USA.
Secondary ion mass spectrometry (SIMS) enables individual nano-object characterization by analyzing them one-by-one. A Nano-Assisted Laser Desorption/Ionization (NALDI™) plate effectively isolates these nano-objects for precise compositional analysis.
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