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Related Experiment Video

Updated: May 6, 2026

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Open loop Kelvin probe force microscopy with single and multi-frequency excitation.

L Collins1, J I Kilpatrick, S A L Weber

  • 1School of Physics, University College Dublin, Belfield, Dublin 4, Ireland. Conway Institute of Biomedical and Biomolecular Research, University College Dublin, Belfield, Dublin 4, Ireland.

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|November 2, 2013
PubMed
Summary

Open loop Kelvin probe force microscopy (OL-KPFM) offers quantitative, crosstalk-free surface potential measurements. This method overcomes limitations of conventional closed loop (CL)-KPFM, providing more accurate surface potential data for materials like graphene.

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Area of Science:

  • Surface Science
  • Nanotechnology
  • Materials Science

Background:

  • Conventional Kelvin probe force microscopy (KPFM) uses closed-loop (CL) bias feedback to measure surface potential (SP).
  • CL-KPFM is susceptible to systematic errors and topographical crosstalk due to non-electrostatic signal contributions.
  • Accurate SP measurements are crucial for understanding material properties and device performance.

Purpose of the Study:

  • To investigate open-loop (OL)-KPFM modes for quantitative and crosstalk-free SP measurements.
  • To contrast OL-KPFM performance with conventional CL-KPFM for graphene on Cu foil.
  • To identify and quantify errors in CL-KPFM measurements.

Main Methods:

  • Implementation and testing of OL-KPFM in single and multi-frequency excitation regimes.
  • Direct comparison of SP measurements obtained via OL-KPFM and CL-KPFM.
  • Analysis of graphene structures (single/multilayer) and Al2O3-coated surfaces.

Main Results:

  • OL-KPFM successfully yielded quantitative SP measurements.
  • The SP difference between single and multilayer graphene was 63 ± 11 mV using OL-KPFM.
  • An offset of 55 mV was observed between absolute SP values from OL-KPFM and CL-KPFM, attributed to non-electrostatic contributions in CL-KPFM.

Conclusions:

  • OL-KPFM provides a more accurate and reliable method for determining surface potential compared to CL-KPFM.
  • Non-electrostatic contributions significantly impact CL-KPFM accuracy, leading to systematic errors.
  • OL-KPFM is a valuable technique for precise surface potential analysis in nanomaterials.