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The electrically detected magnetic resonance microscope: combining conductive atomic force microscopy with

Konrad Klein1, Benedikt Hauer, Benedikt Stoib

  • 1Walter Schottky Institut, Technische Universität München, Am Coulombwall 4, 85748 Garching, Germany.

The Review of Scientific Instruments
|November 5, 2013
PubMed

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