3D defect segmentation on CT volume data using morphology and resample techniques

Yongning Zou1, Jue Wang, Jianwei Li

  • 1ICT Research Center, Key Laboratory of Optoelectronic Technology and System of the Education, Ministry of China, Chongqing University, Chongqing, China College of Optoelectronic Engineering, Chongqing University, Chongqing, China.

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