Organic ion imaging beyond the limit of static secondary ion mass spectrometry
J M McMahon1, N N Dookeran, P J Todd
1Chemical and Analytical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA.
Abstract:
Secondary ion mass spectra and images were obtained from spikes of choline chloride, acetylcholine chloride, and methylphenylpyridinium iodide deposited onto specimens of porcine brain tissue. Samples were subsequently subjected to a dose of 10-keV Cs(+) sufficient to suppress secondary ion emission characteristic of the targeted analytes. Following ablation of the samples by massive glycerol clusters generated by electrohydrodynamic emission, secondary ion mass spectra and images could be obtained that reflected the identity and location of the spiked analytes. The absolute intensity of secondary ion emission that followed ablation was found to be between 30 and 100% of the intensity obtained prior to exposure to the high dose of Cs'. Not all chemical noise is removed by ablation, however, so that the signal-to-noise ratios after ablation correspond to between 10 and 85% of their values observed under conditions of low primary ion dose.
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