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Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview01:19

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Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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A Microfluidic Chip for ICPMS Sample Introduction
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Inductively coupled plasma mass spectrometry with an electrically floating sampling interface.

K Hu1, R S Hauk

  • 1Ames Laboratory-US. Department of Energy, Department of Chemistry, Iowa State University, 50011, Ames, Iowa, USA.

Journal of the American Society for Mass Spectrometry
|November 15, 2013
PubMed
Summary

Biasing the sampler and skimmer in inductively coupled plasma mass spectrometry (ICP-MS) enhances sensitivity and extends the dynamic range. This interface modification improves Co(+) detection limits without increasing background noise.

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Area of Science:

  • Analytical Chemistry
  • Mass Spectrometry
  • Atomic Spectroscopy

Background:

  • Conventional inductively coupled plasma mass spectrometry (ICP-MS) utilizes grounded sampler and skimmer cones.
  • Optimizing ion transmission and detection sensitivity in ICP-MS is crucial for trace element analysis.
  • Understanding the impact of interface potentials on ion beam characteristics is an ongoing area of research.

Purpose of the Study:

  • To investigate the effect of applying modest DC voltages to the sampler and skimmer in ICP-MS.
  • To evaluate the impact of sampler/skimmer biasing on analytical sensitivity and linear dynamic range.
  • To determine if interface potential modifications affect background signals in ICP-MS.

Main Methods:

  • Modest DC voltages (+10 to +50 V) were applied to the sampler and/or skimmer cones.
  • An alternative configuration involved biasing the skimmer while leaving the sampler floating.
  • Sensitivity, molar sensitivity for specific ions (Co+, CO+, Rh+, Ho+), linear dynamic range, and background signals were measured.

Main Results:

  • Biasing the skimmer with a floating sampler improved Co(+) sensitivity sixfold.
  • Similar molar sensitivities were observed for CO(+), Rh(+), and Ho(+) ions.
  • The upper limit of the linear dynamic range was extended to approximately 100 ppm.
  • No significant changes in background signals were detected.

Conclusions:

  • Applying modest DC voltages to the sampler and skimmer interface in ICP-MS is a viable method for enhancing analytical performance.
  • Skimmer biasing, particularly with a floating sampler, offers significant sensitivity improvements for certain ions.
  • This interface modification extends the linear dynamic range without compromising the signal-to-noise ratio, making it suitable for a wider range of sample concentrations.