Robust analysis of synthetic label-free DNA junctions in solution by X-ray scattering and molecular simulation

Kyuhyun Im1, Daun Jeong, Jaehyun Hur

  • 11] Frontier Research Laboratory, Samsung Advanced Institute of Technology, Samsung Electronics, Yongin, Gyeonggi-do 446-712, South Korea [2].

Scientific Reports
|November 16, 2013
PubMed