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06:48
A Multimodal Wide-Field Fourier-Transform Raman Microscope
Published on: December 30, 2025
901
A wide spectral range reflectance and luminescence imaging system
Tapani Hirvonen1, Niko Penttinen, Markku Hauta-Kasari
1Institute of Photonics, University of Eastern Finland, P.O.Box 111, FI-80101 Joensuu, Finland. tapani.r.hirvonen@uef.fi.
Sensors (Basel, Switzerland)
|November 16, 2013
Summary
We developed a versatile wide spectral range imaging system for advanced material analysis. This customizable system offers flexible resolutions and measurement geometries for diverse applications.
Area of Science:
- Optics and Photonics
- Materials Science
- Spectroscopy
Background:
- Advanced imaging techniques are crucial for detailed material characterization.
- Existing spectral imaging systems often have limitations in spectral range or spatial resolution.
Purpose of the Study:
- To introduce a novel wide spectral range imaging system.
- To demonstrate its flexibility in spatial resolution and measurement geometries.
- To evaluate its performance for reflectance and luminescence measurements.
Main Methods:
- Development of a customizable imaging system covering 200-2500 nm spectral range.
- Integration of variable spatial resolution capabilities (minimum 250 μm).
- Testing and validation using reflectance and luminescence measurements.
Main Results:
- The system successfully acquired spectral images across a wide spectral range.
- Performance evaluation confirmed its capabilities and flexibility.
- Demonstrated potential for customization for transmittance measurements.
Conclusions:
- The developed wide spectral range imaging system is highly adaptable.
- It offers significant potential for various practical applications in material science and beyond.
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