X-ray fluorescence analysis using synchrotron radiation at the photon factory.

Area of Science:

• Analytical Chemistry
• Materials Science
• Physics

Background:

• X-ray fluorescence (XRF) is a powerful analytical technique for elemental composition determination.
• Synchrotron radiation sources offer unique properties for advanced XRF applications.
• Optimizing excitation modes is crucial for improving detection limits and analytical capabilities.

Purpose of the Study:

• To describe X-ray fluorescence experiments conducted at the Photon Factory, Japan.
• To evaluate different excitation modes for energy-dispersive XRF.
• To explore the potential of monochromatic excitation for chemical state analysis and grazing incidence XRF for near-surface analysis.

Main Methods:

• Utilized an energy-dispersive X-ray fluorescence system.
• Employed continuum and monochromatic excitation modes (crystal and wide band pass monochromators).
• Applied grazing incidence X-ray fluorescence with total reflection supports for solution samples.

Main Results:

• Achieved minimum detection limits below 0.1 ppm and 0.1 pg for thin samples without line interference.
• Demonstrated the suitability of monochromatic excitation for chemical state analysis.
• Successfully performed near-surface and trace analysis of solution samples.

Conclusions:

• Diverse excitation modes in XRF offer flexibility and improved performance.
• Monochromatic excitation enhances the chemical state analysis capabilities of XRF.
• Grazing incidence XRF is well-suited for synchrotron radiation and near-surface analysis.