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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Single-shot soft x-ray laser linewidth measurement using a grating interferometer.

Y Wang, L Yin, S Wang

|November 28, 2013

Summary

This summary is machine-generated.

A new method accurately measured the spectral linewidth of a nickel-like palladium soft x-ray laser in a single shot. This technique enhances the development of ultrafast femtosecond plasma-based soft x-ray lasers.

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Area of Science:

Atomic, Molecular and Chemical Physics
Optics
Plasma Physics

Background:

Soft x-ray lasers are crucial for advanced applications.
Accurate measurement of their spectral linewidth is essential for understanding temporal coherence.
Existing methods can be time-consuming or require multiple shots.

Purpose of the Study:

To develop and demonstrate a single-shot technique for measuring the spectral linewidth of a soft x-ray laser.
To determine the temporal coherence of a 14.7 nm Ni-like Pd soft x-ray laser.

Main Methods:

Utilized a soft x-ray diffraction grating interferometer to measure linewidth.
Employed the time delay introduced by gratings to assess temporal coherence.
Performed Fourier transform analysis on fringe visibility data.

Main Results:

Successfully measured the spectral linewidth of the 4d1S0-4p1P1 Ni-like Pd lasing line.
Determined the relative linewidth to be Δλ/λ=3×10(-5).
Demonstrated a rapid and accurate single-shot measurement capability.

Conclusions:

The developed interferometer provides an efficient method for soft x-ray laser characterization.
This technique facilitates the advancement of femtosecond plasma-based soft x-ray lasers.
Accurate linewidth measurement is key to controlling and optimizing soft x-ray laser properties.