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Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis.

Julian Stirling¹, Richard A J Woolley, Philip Moriarty

¹School of Physics and Astronomy, The University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom.

The Review of Scientific Instruments

|December 3, 2013

Summary

This summary is machine-generated.

We introduce SPIW (scanning probe image wizard), a new software tool that automates scanning probe microscopy data analysis. This toolbox enhances image visualization and statistical analysis, even for challenging contaminated surfaces.

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Area of Science:

Materials Science
Surface Science
Microscopy

Background:

Scanning probe microscopy (SPM) generates complex topographical data.
Analysis of SPM images often requires specialized software and manual processing.
Challenges include surface contamination and artifacts like step edges.

Purpose of the Study:

To introduce SPIW (scanning probe image wizard), a novel image processing toolbox for SPM data.
To automate routine and complex aspects of SPM image analysis.
To improve image visualization and quantitative analysis of surface structures.

Main Methods:

Development of a new image processing toolbox named SPIW.
Implementation of specialized routines for handling surface contamination and step edges.
Inclusion of algorithms for atomic and molecular resolution image enhancement.

Main Results:

SPIW successfully automates various SPM data analysis tasks.
The toolbox effectively visualizes and analyzes images with surface contamination and step edges.
SPIW provides statistical data on surface structure for high-resolution images.

Conclusions:

SPIW offers an efficient solution for automating SPM image analysis.
The toolbox improves the quality and interpretability of SPM data.
SPIW facilitates advanced surface structure characterization using scanning probe microscopy.