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Errors and their mitigation at the kirchhoff-law-johnson-noise secure key exchange
1Department of Electrical and Computer Engineering, Texas A&M University, College Station, Texas, United States of America.
Abstract:
A method to quantify the error probability at the Kirchhoff-law-Johnson-noise (KLJN) secure key exchange is introduced. The types of errors due to statistical inaccuracies in noise voltage measurements are classified and the error probability is calculated. The most interesting finding is that the error probability decays exponentially with the duration of the time window of single bit exchange. The results indicate that it is feasible to have so small error probabilities of the exchanged bits that error correction algorithms are not required. The results are demonstrated with practical considerations.
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