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Updated: May 5, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
Experimental evidence on the mechanism of dissociative electron attachment to formic acid
1Department of Chemistry, University of Fribourg, Chemin du Musée 9, 1700 Fribourg, Switzerland.
Abstract:
Two mechanisms for dissociative electron attachment in HCOOH, the formation of HCOO(-)+H, were proposed in the literature: (i) via a direct electron attachment into a σ* resonance, augmented by dipole binding of the incident electron [G. A. Gallup et al., Phys. Rev. A 79, 042701 (2009)], and (ii) with the 1.8 eV π* resonance as a doorway state, linked to the products by symmetry lowering-distortion of the temporary anion, primarily the C-H bond, from the planar symmetry [T. N. Rescigno et al., Phys. Rev. Lett. 96, 213201 (2006)]. The later mechanism implies a reduction of the cross section upon deuteration of the hydrogen bonded to the C atom, whereas the former mechanism would leave the cross section unaffected. Our experimental absolute cross sections for the four isotopomers of formic acid show that deuteration on the C atom reduces the cross section value only marginally (by 12%) compared to deuteration on the O atom (reduction by a factor of 16), and thus favor mechanism (i).
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