Related Experiment Video
Updated: May 5, 2026

Application of DNA Fingerprinting using the D1S80 Locus in Lab Classes
Published on: July 17, 2021
Characterising the STR locus D6S1043 and examination of its effect on stutter rates
Jo-Anne Bright1, Kate E Stevenson, Michael D Coble
1ESR Ltd, Private Bag 92021, Auckland 1025, New Zealand; Department of Statistics, University of Auckland, Private Bag 92019, Auckland 1025, New Zealand.
Abstract:
The forensic analysis of DNA is most often undertaken by the amplification of short tandem repeats (STR) using the polymerase chain reaction (PCR). DNA amplification can result in production of the target allele amplicon and a by-product called stutter. Stutter is the result of the miscopy of the target allele and is typically one repeat smaller. Stutter is traditionally described as a ratio of stutter and allele height; stutter ratio (SR). The challenge to DNA profile interpretation is most serious whenever stutter products are of a similar height to the minor allelic peaks in a mixed DNA profile. An accurate assignment of peaks and the prediction of their height is important when objectively interpreting forensic DNA profiles. The longest uninterrupted stretch (LUS) of tandem repeats within the allele has previously been shown to be a good predictor of stutter ratio. LUS is determined by sequencing a range of observed alleles at a locus. The locus D6S1043 is a relatively new locus to appear in commercial forensic DNA testing kits. To date however, there has been no comprehensive report of sequencing of this locus. In this work, we sequence a sample of D6S1043 alleles to determine LUS values and investigate allele repeat number and LUS as explanatory variables for SR.
More Related Videos
09:09Foreign Accent and Forensic Speaker Identification in Voice Lineups: The Influence of Acoustic Features Based on Prosody
Published on: September 27, 2024
05:03Author Spotlight: Unveiling Mechanisms of Stress Resilience - Significant Findings, Advancements, and Future Research
Published on: December 15, 2023