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Form factor dispersion at La M5,4 edges and average density of resonant atoms
S Smadici1, J C T Lee, G Logvenov
1Department of Physics and Astronomy, University of Louisville, KY 40292, USA. Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, IL 61801, USA.
Abstract:
Resonant soft x-ray scattering on complex oxide superlattices shows very large variations in the superlattice reflection position and intensity near La M5,4 edges. Resonant dispersion of the La x-ray form factor describes the observations well. We determine the average density of resonant La atoms and the thickness of superlattice layers.
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