Related Experiment Video
Updated: May 5, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Strong three-dimensional field localization and enhancement on deep sinusoidal gratings with two-dimensional
Abstract:
The study of total light absorption due to excitation of localized surface plasmons on deep metallic crossed gratings having a sinusoidal profile with a two-dimensional periodicity shows a very strong increase in the electric field intensity, reaching 800 times the incident intensity. The region with high intensity is strongly localized at the groove top and is characterized by a volume much smaller than the diffraction limit, both in transverse direction along the grating plane, and in longitudinal direction when going away from the grating surface. The field enhancement and its localization are much more pronounced than in shallow gratings.
More Related Videos
12:08Fabrication of High Contrast Gratings for the Spectrum Splitting Dispersive Element in a Concentrated Photovoltaic System
Published on: July 18, 2015
08:49Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures
Published on: December 1, 2023