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AMEBaS: Automatic Midline Extraction and Background Subtraction of Ratiometric Fluorescence Time-Lapses of Polarized Single Cells
Published on: June 23, 2023
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Using the low-pass monogenic signal framework for cell/background classification on multiple cell lines in
Firas Mualla1, Simon Schöll, Björn Sommerfeldt
1Pattern Recognition Lab, Friedrich-Alexander University Erlangen-Nuremberg, Erlangen, Germany, firas.mualla@cs.fau.de.
International Journal of Computer Assisted Radiology and Surgery
|December 12, 2013
Summary
Local phase from the monogenic signal framework significantly improves cell detection in bright-field microscopy. This method outperforms traditional defocused images for cell/background classification tasks.
Area of Science:
- Microscopy
- Image Analysis
- Computational Biology
Background:
- Bright-field microscopy often uses image defocusing to enhance cell contrast.
- The Transport of Intensity Equation (TIE) relates image contrast to physical light phase.
- The monogenic signal framework offers an approximation for solving the TIE.
Purpose of the Study:
- To evaluate if local phase derived from the monogenic signal framework improves cell/background classification accuracy.
- To compare the performance of local phase against defocused images in cell detection.
Main Methods:
- Tested on three cell lines (CHO, L929, Sf21) using bright-field microscopy images.
- Generated local phase and energy images via the low-pass monogenic signal framework.
- Employed machine learning classifiers (Random Forest, SVM with linear and RBF kernels) for classification.
Main Results:
- Local phase significantly improved classification accuracy over defocused images (7.3% RF, 11.6% linear SVM, 10.2% RBF SVM).
- Discriminative power order: at-focus signal < local energy < defocused signal < local phase.
- Local energy showed superiority over defocused signal for suspended cells.
Conclusions:
- Local phase computed via the low-pass monogenic signal framework is superior to defocused images for cell/background classification.
- This approach enhances accuracy in pixel-patch classification for bright-field microscopy.

