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High-energy x-ray diffractometer for nondestructive strain depth profile measurement.

M Y Al-Shorman1, T C Jensen2, J N Gray2

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This study presents a new high-energy X-ray diffraction system for non-destructively measuring strain profiles in polycrystalline materials. The technique achieves detailed depth profiling in aluminum and titanium samples.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Analytical Chemistry

Background:

  • Strain measurement is crucial for understanding material performance and degradation.
  • Non-destructive techniques are preferred for analyzing sensitive or in-situ samples.
  • Existing methods may have limitations in depth resolution or material applicability.

Purpose of the Study:

  • To introduce a novel lab-based high-energy X-ray diffraction (XRD) system.
  • To present a new approach for non-destructively measuring strain profiles in polycrystalline samples.
  • To validate the system and approach using simulation models and experimental data.

Main Methods:

  • Utilized a lab-based high-energy X-ray diffraction system.
  • Employed tungsten K(α1) characteristic radiation from an industrial X-ray tube.
  • Developed a simulation model to determine strain values from collected XRD data.

Main Results:

  • Successfully measured strain profiles non-destructively in polycrystalline aluminum and titanium samples.
  • Achieved depth profiling up to 1 mm in aluminum and 300 μm in titanium.
  • Demonstrated a depth resolution of 20 μm for the strain measurements.

Conclusions:

  • The developed high-energy XRD system and strain profiling approach are effective for non-destructive analysis.
  • The technique provides valuable insights into subsurface strain distributions in materials.
  • This method offers high depth resolution for characterizing surface-treated materials like shot-peened samples.