Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

16.0K
Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
16.0K
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

12.3K
Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...
12.3K
Upsampling01:22

Upsampling

745
Managing signal sampling rates is essential in digital signal processing to maintain signal integrity. A decimated signal, characterized by a reduced frequency range due to its lower sampling rate, can be upsampled by inserting zeros between each sample. This upsampling process expands the original spectrum and introduces repeated spectral replicas at intervals dictated by the new Nyquist frequency. To refine this zero-inserted sequence, it is passed through a lowpass filter with a cutoff...
745

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

circVDJ-seq for T cell clonotype detection in single-cell and spatial multi-omics.

Genome medicine·2026
Same author

The dorsal aortic compartment is a developmental source of brown adipose tissue in mice.

Nature communications·2026
Same author

Mechanisms of Barium Sulfate Dissolution through the Lens of Kinetic Monte Carlo Simulations.

ACS omega·2025
Same author

On-chip single-crystal plasmonic optoelectronics for efficient hot carrier collection and photovoltage detection.

Light, science & applications·2025
Same author

The Next 25 Years of Nanoscience and Nanotechnology: A <i>Nano Letters</i> Roadmap.

Nano letters·2025
Same author

Mid-term survival and physiological joint angles after double level osteotomy of severe varus osteoarthritis.

Knee surgery, sports traumatology, arthroscopy : official journal of the ESSKA·2025

Related Experiment Video

Updated: May 4, 2026

Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform
06:25

Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

Published on: February 12, 2014

7.8K

Lateral resolution enhancement of vertical scanning interferometry by sub-pixel sampling.

Rolf S Arvidson1, Cornelius Fischer1, Dale S Sawyer2

  • 1MARUM/Geowissenschaften FB5, Klagenfurter Straße, Universität Bremen, 28359 Bremen, Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|January 9, 2014
PubMed
Summary

This study enhances the spatial resolution of vertical scanning interferometry using image processing and sub-pixel positioning. This advancement improves lateral resolution, enabling better integration of microscopy data across different observational lengths.

More Related Videos

Highly Resolved Intravital Striped-illumination Microscopy of Germinal Centers
10:07

Highly Resolved Intravital Striped-illumination Microscopy of Germinal Centers

Published on: April 9, 2014

9.8K
Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures
08:49

Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures

Published on: December 1, 2023

2.1K

Related Experiment Videos

Last Updated: May 4, 2026

Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform
06:25

Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

Published on: February 12, 2014

7.8K
Highly Resolved Intravital Striped-illumination Microscopy of Germinal Centers
10:07

Highly Resolved Intravital Striped-illumination Microscopy of Germinal Centers

Published on: April 9, 2014

9.8K
Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures
08:49

Author Spotlight: Unveiling the Potential of VSFG Microscopy in Studying Mesoscopically Heterogeneous Self-Assembled Structures

Published on: December 1, 2023

2.1K

Area of Science:

  • Optical microscopy
  • Nanotechnology
  • Surface metrology

Background:

  • Vertical scanning interferometry (VSI) offers high vertical resolution and large field-of-view imaging.
  • Current VSI methods face limitations in achieving high lateral resolution, hindering the study of nanoscale features.
  • Integrating data across different observational lengths remains a challenge in microscopy.

Purpose of the Study:

  • To significantly enhance the spatial resolution of vertical scanning interferometry.
  • To combine high vertical resolution with improved lateral resolution for comprehensive surface analysis.
  • To overcome limitations in current microscopy techniques for studying features that vary with observational length.

Main Methods:

  • Application of common image enhancement principles.
  • Implementation of sub-pixel sample positioning techniques.
  • Utilizing atomic force microscope calibration grids and known dimension materials for validation.

Main Results:

  • Achieved significant enhancement in the spatial resolution of VSI.
  • Demonstrated improved lateral resolution capabilities.
  • Successfully validated the method using standard calibration samples.

Conclusions:

  • The developed method successfully enhances VSI's lateral resolution.
  • This approach integrates high vertical and improved lateral resolution, addressing a key microscopy challenge.
  • The technique facilitates the study of properties and processes across varying observational lengths.