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Single-photon property characterization of 1.3 μm emissions from InAs/GaAs quantum dots using silicon avalanche

P Y Zhou1, X M Dou1, X F Wu1

  • 1State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of SciencesP.O. Box 912, Beijing 100083, China.

Scientific Reports
|January 11, 2014
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