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Quantifying molecular stiffness and interaction with lateral force microscopy.

Alfred John Weymouth¹, Thomas Hofmann, Franz J Giessibl

¹Universität Regensburg, Regensburg 93053, Germany.

Science (New York, N.Y.)

|February 8, 2014

Summary

This summary is machine-generated.

Atomic force microscopy (AFM) resolution improves with carbon monoxide (CO) tips, but lateral forces cause distortions. Lateral force microscopy (LFM) overcomes this by measuring tip stiffness, revealing new insights into molecular interactions.

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Area of Science:

Surface science
Nanotechnology
Scanning probe microscopy

Background:

Atomic force microscopy (AFM) achieves high spatial resolution using a carbon monoxide (CO) molecule at the tip.
Lateral forces acting on the CO molecule can distort AFM images, limiting the analysis of weakly bonded structures.

Purpose of the Study:

To investigate the impact of lateral forces on AFM imaging.
To determine the torsional spring constant of a CO-terminated tip.
To explore the capability of Lateral Force Microscopy (LFM) for probing lateral stiffness.

Main Methods:

Utilized Lateral Force Microscopy (LFM) to measure tip-sample interactions.
Determined the torsional spring constant of the CO-terminated tip.

Main Results:

The torsional spring constant of the CO-terminated tip was measured to be 0.24 N/m.
This stiffness is lower than that of a surface molecule.
Demonstrated LFM's ability to probe lateral stiffnesses inaccessible to normal-force AFM.

Conclusions:

LFM enhances spatial resolution in AFM by accounting for lateral forces.
The stiffness of a CO-terminated tip is influenced by bonding partners and the local environment.
This study provides a method for analyzing laterally weak structures with AFM.