Electrical heating synchronized with IR imaging to determine thin film defects

Area of Science:

• Materials Science
• Electrical Engineering
• Non-destructive Testing

Background:

• Measuring conductive thin film properties is vital for production control, reliability, and functionality.
• Existing laboratory methods for thin film quality assessment are often unsuitable for production environments.

Purpose of the Study:

• To develop a simple, synchronized heating and IR-imaging system for assessing conductive thin films.
• To demonstrate the system's applicability using Indium Tin Oxide (ITO) films.
• To automate signal processing for defect analysis.

Main Methods:

• Implemented a synchronized heating and infrared (IR) imaging system.
• Utilized Indium Tin Oxide (ITO) coated PET films with induced defects (bending).
• Developed automated signal processing algorithms for data analysis.

Main Results:

• The developed system successfully identified and localized defects in conductive thin films.
• The method proved effective in defining different types of film breakages.
• Automated signal processing facilitated efficient defect analysis.

Conclusions:

• The synchronized heating and IR-imaging system offers a viable solution for in-line measurement of conductive thin films.
• This approach enhances production control and ensures the reliability of end products.
• The method is suitable for quality assessment of materials like Indium Tin Oxide (ITO).