Super-resolution Fluorescence Microscopy
Imperfections in Crystal Structure: Point, Line and Plane Defects
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Demonstration of a Hyperlens-integrated Microscope and Super-resolution Imaging
Published on: September 8, 2017
Researchers created a large-scale optical exceptional point structure using dielectric layers. This enables unidirectional reflectionless light transport and abrupt phase transitions for advanced optical devices.
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