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Systematic reliability study of top-gate p- and n-channel organic field-effect transistors

Do Kyung Hwang1, Canek Fuentes-Hernandez, Mathieu Fenoll

  • 1Center for Organic Photonics and Electronics (COPE), School of Electrical and Computer Engineering, Georgia Institute of Technology , Atlanta, Georgia 30332-0250, United States.

ACS Applied Materials & Interfaces
|February 15, 2014
PubMed

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