A novel low energy electron microscope for DNA sequencing and surface analysis.

M Mankos1, K Shadman1, H H J Persson2

  • 1Electron Optica Inc., 1000 Elwell Court ♯110, Palo Alto, CA 94303, USA.

Ultramicroscopy
|February 15, 2014
PubMed
Summary

Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) offers sub-nanometer imaging resolution for nanostructures. This novel technique shows promise for high-speed DNA sequencing by imaging nucleobases without labels.

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