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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 2, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Surface force measurements at kaolinite edge surfaces using atomic force microscopy.

Jing Liu¹, Linda Sandaklie-Nikolova², Xuming Wang¹

¹Department of Metallurgical Engineering, College of Mines and Earth Sciences, University of Utah, 135 South 1460 East, Room 412, Salt Lake City, UT 84112, USA.

Journal of Colloid and Interface Science

|February 25, 2014

Summary

This study reveals kaolinite edge surfaces have a point of zero charge (PZC) below pH 4, contrary to prior beliefs. These findings aid in optimizing kaolinite flotation for better mineral resource recovery.

Keywords:

Atomic force microscopy Edge surface Kaolinite Surface charge

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Area of Science:

Geochemistry
Materials Science
Surface Chemistry

Background:

Kaolinite edge surfaces exhibit unique properties influencing mineral processing.
Understanding surface charge is crucial for predicting kaolinite behavior in aqueous systems.

Purpose of the Study:

To characterize the surface properties of kaolinite edge surfaces.
To determine the point of zero charge (PZC) of kaolinite edge surfaces.
To provide insights for enhanced kaolinite flotation strategies.

Main Methods:

Preparation of kaolinite edge surfaces within an epoxy resin sandwich structure.
Atomic Force Microscopy (AFM) for examining particle thickness (~38.3 nm).
Surface charge evaluation using a sharp silicon tip to determine PZC.

Main Results:

Kaolinite particles averaged 38.3 nm ± 11.7 nm in thickness.
The point of zero charge (PZC) for kaolinite edge surfaces was found to be below pH 4.
This PZC is lower than previously assumed, attributed to minimal isomorphous substitution.

Conclusions:

The determined PZC of kaolinite edge surfaces challenges traditional views.
Results align with observed kaolinite aggregation and flotation behaviors.
Findings support the development of improved flotation methods for efficient resource utilization.