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Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope

Z Lee1, H Rose1, O Lehtinen1

  • 1Universität Ulm, Materialwissenschaftliche Elektronenmikroskopie, Albert-Einstein-Allee 11, 89081 Ulm, Germany.

Ultramicroscopy
|February 26, 2014
PubMed

Keywords:
-correctionContrastElectron doseLow-voltageResolutionSamplingSignal-to-noise ratio (SNR)

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