Jove
Visualize
Contact Us

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.1K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.1K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Prospects for observing and localizing gravitational-wave transients with Advanced LIGO, Advanced Virgo and KAGRA.

Living reviews in relativity·2020
Same author

Tests of General Relativity with GW170817.

Physical review letters·2019
Same author

Constraining the p-Mode-g-Mode Tidal Instability with GW170817.

Physical review letters·2019
Same author

Search for Subsolar-Mass Ultracompact Binaries in Advanced LIGO's First Observing Run.

Physical review letters·2018
Same author

GW170817: Measurements of Neutron Star Radii and Equation of State.

Physical review letters·2018
Same author

Search for Tensor, Vector, and Scalar Polarizations in the Stochastic Gravitational-Wave Background.

Physical review letters·2018
Same journal

Cluster assisted soft-landing hub (CLASH): An instrument for surface desorption and deposition using a pulsed cluster ion source.

The Review of scientific instruments·2026
Same journal

Influence of pre-ionization parameters on multi-channel discharge characteristics of field-distortion switch gaps.

The Review of scientific instruments·2026
Same journal

A Joule-Thomson low-temperature scanning tunneling microscope with vector magnet and rotatable scanning head.

The Review of scientific instruments·2026
Same journal

Fiber-optic triggering of a two-stage high-current linear transformer driver with laser energy below 100 μJ.

The Review of scientific instruments·2026
Same journal

Optimization of laboratory-scale x-ray absorption spectroscopy (XAS) apparatus for nuclear fuel research.

The Review of scientific instruments·2026
Same journal

Compressed multi-scale entropy and its application in mechanical fault diagnosis.

The Review of scientific instruments·2026
See all related articles
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: May 2, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.3K

A high-bandwidth amplitude estimation technique for dynamic mode atomic force microscopy.

K S Karvinen1, S O R Moheimani1

  • 1School of Electrical Engineering and Computer Science, The University of Newcastle, Callaghan, NSW 2308, Australia.

The Review of Scientific Instruments
|March 6, 2014
PubMed
Summary
This summary is machine-generated.

A new high-bandwidth amplitude estimation technique improves atomic force microscopy (AFM) speed. This method enhances lock-in amplifier performance for faster, more robust high-speed and multifrequency AFM imaging.

More Related Videos

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

20.8K
Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
05:34

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Published on: June 30, 2023

2.9K

Related Experiment Videos

Last Updated: May 2, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

11.3K
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

20.8K
Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
05:34

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Published on: June 30, 2023

2.9K

Area of Science:

  • Atomic Force Microscopy
  • Instrumentation
  • Signal Processing

Background:

  • High-speed atomic force microscopy (HS-AFM) requires advanced amplitude estimation.
  • Existing methods like RMS to DC and lock-in amplifiers have limited bandwidth.
  • Current techniques are often complex or lack robustness for HS-AFM.

Purpose of the Study:

  • To introduce a novel high-bandwidth amplitude estimation technique for HS-AFM.
  • To address the limitations of conventional amplitude estimation methods.
  • To enhance the speed and reliability of AFM imaging.

Main Methods:

  • Developed a new estimation technique inspired by microwave and RF circuit design.
  • Utilized phase cancellation to improve lock-in amplifier performance.
  • Designed and implemented a custom circuit for experimental validation.

Main Results:

  • The proposed technique significantly enhances lock-in amplifier performance.
  • Experimental validation confirmed the improvements in amplitude estimation.
  • The method is suitable for high-speed and multifrequency AFM applications.

Conclusions:

  • The new technique overcomes bandwidth limitations of conventional methods.
  • It offers a robust and implementable solution for HS-AFM.
  • This advancement enables faster and more versatile AFM imaging.