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Updated: May 2, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Wee Tee Soh1, Bin Peng1, Guozhi Chai2
1Center for Superconducting and Magnetic Materials, Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117551.
A novel shorted microstrip method simplifies Spin Rectification Effect (SRE) measurements. This technique enables sensitive quantification and simultaneous determination of SRE contributions in Permalloy thin films.
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