Related Experiment Video
Updated: May 2, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Analysis of plasma distribution near the extraction region in surface produced negative ion sources
1Monozukuri Department, Tokyo Metropolitan College of Industrial Technology, Higashioi, Shinagawa, Tokyo 140-0011, Japan.
Abstract:
In study of a negative ion source, it is important to understand the plasma characteristics near the extraction region. A recent experiment in the NIFS-R&D ion source has suggested that a "double ion plasma layer" which is a region consisting of hydrogen positive and negative ions exists near the plasma grid (PG). Density distribution of plasma near the extraction region is studied analytically. It is shown that the density distribution depends on an amount of the surface produced negative ions and the double ion plasma layer is formed near the PG surface for the case of strong surface production.
Related Concept Videos
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Atomic Emission Spectroscopy: Lab
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
Atomic Emission Spectroscopy: Overview
Ion-Exchange Chromatography
Atomic Emission Spectroscopy: Instrumentation

