An AFM-based pit-measuring method for indirect measurements of cell-surface membrane vesicles

Xiaojun Zhang1, Yuan Chen2, Yong Chen1

  • 1Nanoscale Science and Technology Laboratory, Institute for Advanced Study, Nanchang University, Nanchang, Jiangxi 330031, China; Department of Biotechnology, Nanchang University, Nanchang, Jiangxi 330031, China.

Summary

Atomic force microscopy (AFM) was adapted to measure cell-surface membrane vesicles by inducing their transformation into detectable pits. This novel method revealed nanoscale and microscale vesicle populations on endothelial cells.

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