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Updated: May 2, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
1Eric Jonsson School of Electrical Engineering and Computer Science, University of Texas at Dallas, Richardson, TX 75083 USA. He is also with the Department of Mathematics, Imperial College London, SW7 2AZ U.K.
This study introduces a new method for point-based image registration, addressing heteroscedastic noise in control point localization. The approach improves accuracy in fluorescence microscopy by using generalized least squares for better target registration error (TRE) and localization registration error (LRE) estimation.
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