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Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
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Related Experiment Video

Updated: May 1, 2026

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight
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Heterodyne moiré surface profilometry.

Wei-Yao Chang, Fan-Hsi Hsu, Kun-Huang Chen

    Optics Express
    |March 26, 2014
    PubMed
    Summary

    This study introduces a new moiré fringe analysis for surface profiling. The technique uses a CMOS camera and fast Fourier transform (FFT) analysis to achieve precise measurements with minimal error.

    Area of Science:

    • Optical Metrology
    • Surface Profilometry
    • Image Processing

    Background:

    • Traditional surface measurement techniques can be limited in precision and speed.
    • Moiré fringe analysis offers a non-contact method for surface profiling.
    • Existing methods may struggle with noise reduction and precise phase extraction.

    Purpose of the Study:

    • To propose a novel moiré fringe analysis technique for accurate object surface profiling.
    • To integrate heterodyne signal capture with fast Fourier transform (FFT) analysis for enhanced phase extraction.
    • To demonstrate a high-precision, noise-resistant surface measurement method.

    Main Methods:

    • A novel heterodyne moiré fringe analysis technique was developed.
    • Relative grating displacement at constant velocity was applied.

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  • One-dimensional fast Fourier transform (FFT) analysis was performed on each pixel for phase distribution extraction.
  • Surface profile was reconstructed using the derived phase distribution.

    • Main Results:

    • The proposed technique successfully captured heterodyne moiré signals using a CMOS camera.
    • Precise phase distribution was extracted, effectively filtering harmonic noise.
    • The surface profile of a test object was generated with a measurement error of approximately 4.3 μm.
    • The method demonstrated feasibility for accurate surface metrology.

    Conclusions:

    • The novel moiré fringe analysis technique provides a feasible and accurate method for surface profiling.
    • The integration of FFT analysis with heterodyne moiré signals enhances measurement precision and noise immunity.
    • This approach combines the advantages of Talbot effect, projection moiré, FFT, and heterodyne interferometry for advanced optical metrology.