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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Metrology

    Background:

    • Quantitative phase imaging is crucial for analyzing surface topography.
    • Existing methods often lack stability or require active stabilization for reflective samples.
    • Characterizing dynamic elements like liquid crystal cells requires robust, real-time techniques.

    Purpose of the Study:

    • To develop a stable, large field-of-view optical technique for quantitative phase imaging of reflective samples.
    • To enable single-shot, full-field, and robust nanoscale topography measurements.
    • To facilitate real-time characterization of dynamic optical components such as spatial light modulators.

    Main Methods:

    • Implementation of a common-path interferometric design.
    • Utilizing a single-shot, full-field acquisition approach.
    • Leveraging inherent system stability for measurements.

    Main Results:

    • Demonstrated high stability without active stabilization.
    • Achieved robust nanoscale topography measurement of large reflective samples.
    • Enabled reliable, real-time measurement of temporally varying phase retardation in liquid crystal cells.

    Conclusions:

    • The developed technique offers a stable and efficient method for quantitative phase imaging.
    • It has significant potential for real-time characterization of spatial light modulators and other dynamic optical systems.
    • Experimental validation confirms the technique's broad applicability.