Two approaches for ultrafast random bit generation based on the chaotic dynamics of a semiconductor laser

This paper reports the experimental investigation of two different approaches to random bit generation based on the chaotic dynamics of a semiconductor laser with optical feedback. By computing high-order finite differences of the chaotic laser intensity time series, we obtain time series with symmetric statistical distributions that are more conducive to ultrafast random bit generation. The first approach is guided by information-theoretic considerations and could potentially reach random bit generation rates as high as 160 Gb/s by extracting 4 bits per sample. The second approach is based on pragmatic considerations and could lead to rates of 2.2 Tb/s by extracting 55 bits per sample. The randomness of the bit sequences obtained from the two approaches is tested against three standard randomness tests (ENT, Diehard, and NIST tests), as well as by calculating the statistical bias and the serial correlation coefficients on longer sequences of random bits than those used in the standard tests.