Locating damage using integrated global-local approach with wireless sensing system and single-chip impedance

Tzu-Hsuan Lin1, Yung-Chi Lu2, Shih-Lin Hung2

  • 1Sinotech Engineering Consultants, Inc., No. 280, Xinhu 2nd Road, Neihu Distict, Taipei 11494, Taiwan.

Summary

This study introduces a novel integrated global-local approach for building structural damage detection. The method uses a novel embedded frequency response function damage index (NEFDI) for global damage location and electromechanical impedance (EMI) for precise local damage identification.

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