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Updated: May 1, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
2D electron temperature diagnostic using soft x-ray imaging technique
K Nishimura1, A Sanpei1, H Tanaka1
1Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan.
Abstract:
We have developed a two-dimensional (2D) electron temperature (T(e)) diagnostic system for thermal structure studies in a low-aspect-ratio reversed field pinch (RFP). The system consists of a soft x-ray (SXR) camera with two pin holes for two-kinds of absorber foils, combined with a high-speed camera. Two SXR images with almost the same viewing area are formed through different absorber foils on a single micro-channel plate (MCP). A 2D Te image can then be obtained by calculating the intensity ratio for each element of the images. We have succeeded in distinguishing T(e) image in quasi-single helicity (QSH) from that in multi-helicity (MH) RFP states, where the former is characterized by concentrated magnetic fluctuation spectrum and the latter, by broad spectrum of edge magnetic fluctuations.
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