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Sample size requirements for estimating effective dose from computed tomography using solid-state

Sigal Trattner1, Bin Cheng2, Radoslaw L Pieniazek3

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Summary

This study presents a statistical framework to determine the necessary number of scans for accurately measuring effective dose (ED) in computed tomography (CT) using metal-oxide-semiconductor field-effect transistor (MOSFET) dosimeters. The findings show that sample size varies by scanner and protocol, with lower anticipated doses requiring more measurements for precise ED estimation.

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Area of Science:

  • Medical Physics
  • Radiological Sciences
  • Radiation Dosimetry

Background:

  • Effective dose (ED) is crucial for comparing ionizing radiation exposure across different computed tomography (CT) imaging parameters.
  • Estimating ED in CT typically involves anthropomorphic phantoms with metal-oxide-semiconductor field-effect transistor (MOSFET) dosimeters for organ dose measurement.

Purpose of the Study:

  • Establish a statistical framework to determine the optimal sample size for precise and confident estimation of effective dose (ED) in CT.
  • Address practical limitations and variations in MOSFET calibration and readings for accurate ED assessment.

Main Methods:

  • Utilized a statistical scheme to minimize sample size for desired ED precision and confidence, employing the Lagrange multiplier method.
  • Incorporated measurement variations from MOSFET calibration and repeated CT scans.
  • Illustrated sample size requirements for cardiac, chest, and abdomen-pelvis CT protocols on 320-row and 16-row scanners.

Main Results:

  • Sample size requirements for ED estimation varied significantly based on CT scanner and protocol.
  • Higher required precision or confidence, and lower anticipated ED, led to increased sample size needs.
  • For a helical chest protocol with 95% confidence and 5% precision, sample sizes ranged from 30 (320-row scanner, 4 mSv) to 2 (16-row scanner, 10 mSv).

Conclusions:

  • The proposed statistical scheme enables feasible estimation of ED with high precision and confidence, even with modest sample sizes.
  • Advancements in CT technology that lower ED necessitate increased MOSFET measurements to maintain estimation precision and confidence.