Application of X-ray absorption fine structure method for the quantitative analysis of hexavalent chromium in
Mitsuhiro Oki1, Sayaka Morimoto, Miho Muramatsu
1Corporate Research and Development Center, Toshiba Corporation, 1 Komukai Toshiba-cho, Saiwai, Kawasaki 212-8582, Japan.
Abstract:
The X-ray absorption fine structure method was applied for the quantitative analysis of hexavalent Cr in electronic products. The pre-edge peak intensity of the Cr K-edge increased according to the hexavalent Cr amount, and the hexavalent Cr ratio was calculated quantitatively by using the intensity. By combining with inductively coupled plasma atomic emission spectroscopy measurement results that gave the total Cr amount, the absolute amount of hexavalent Cr in chromate conversion coating and plastic samples could be evaluated. The results obtained by this method were in good agreement with those obtained by the chemical analysis method. This method can be successfully applied for the determination of hexavalent Cr amount in electronic products such as chromate conversion coating and plastic.
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