Focused ion beam scanning electron microscopy in biology.

Area of Science:

• Biological imaging and microscopy
• Advanced electron microscopy techniques

Background:

• Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) has become increasingly vital in biological research since 2000.
• FIB-SEM integrates a scanning electron microscope (SEM) with a focused ion beam (FIB) for high-resolution imaging.

Purpose of the Study:

• To provide an overview of FIB-SEM development in biological applications.
• To discuss key aspects of sample preparation and imaging using FIB-SEM.

Main Methods:

• Utilizes a focused ion beam to sequentially remove surface nanometers.
• Employs a scanning electron beam to image the exposed block face, enabling 3D data acquisition (FIB-SEM tomography).
• Can also be used for cross-sectioning biological structures and preparing lamellae for transmission electron microscopy.

Main Results:

• FIB-SEM facilitates detailed three-dimensional reconstruction of biological samples.
• The technique allows for precise preparation of samples for cryo-transmission electron microscopy.
• Enables access to internal structures of biological specimens.

Conclusions:

• FIB-SEM is a versatile tool for biological research, offering significant advancements in 3D imaging and sample preparation.
• Continued development and understanding of sample preparation and imaging protocols are crucial for maximizing FIB-SEM's potential.