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Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Related Experiment Video

Updated: Apr 30, 2026

Frequency Mixing Magnetic Detection Scanner for Imaging Magnetic Particles in Planar Samples
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Single-cycle-PLL detection for real-time FM-AFM applications.

Benedikt Schlecker, Maja Dukic, Blake Erickson

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    |April 25, 2014
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    This study introduces a new phase-locked loop (PLL) architecture for high-speed frequency-modulated atomic force microscopy (AFM) signal demodulation. The novel design overcomes bandwidth limitations and improves performance across various cantilever frequencies.

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    Area of Science:

    • Atomic Force Microscopy
    • Signal Processing
    • Electronics Engineering

    Background:

    • Atomic Force Microscopy (AFM) is a high-resolution surface imaging technique.
    • Frequency-Modulated (FM) AFM enhances sensitivity but faces demodulation bandwidth limitations.
    • Phase-Locked Loops (PLLs) offer excellent noise performance for demodulation.

    Purpose of the Study:

    • To develop a novel PLL architecture for high-speed FM-AFM signal demodulation.
    • To overcome the bandwidth limitations inherent in traditional PLL-based FM demodulators.
    • To improve the noise performance and operational range of FM-AFM systems.

    Main Methods:

    • Implemented single-sideband (SSB) frequency upconversion to translate AFM signals to a fixed intermediate frequency (IF).
    • Developed a model for AM-to-FM noise conversion in PLLs with phase-frequency detectors.
    • Validated the architecture through electrical and AFM measurements using a PCB prototype.

    Main Results:

    • The SSB upconversion successfully translated the AFM signal to a 10 MHz IF, avoiding bandwidth limitations.
    • The developed noise model predicts an upper corner frequency for demodulation bandwidth.
    • The prototype demonstrated the feasibility and effectiveness of the proposed architecture.

    Conclusions:

    • The novel PLL architecture enables high-speed FM-AFM demodulation with improved performance.
    • The SSB upconversion technique effectively addresses bandwidth limitations and broadens the usable cantilever frequency range.
    • The system's noise performance is well-characterized, allowing for optimized operation.