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Quantifying X-Ray Fluorescence Data Using MAPS
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Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on

Wen Bin Li1, Xiao Yue Yang1, Jing Tao Zhu1

  • 1MOE Key Laboratory of Advanced Micro-structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China.

Journal of Synchrotron Radiation
|April 26, 2014
PubMed

Keywords:
EXAFSX-ray fluorescenceXRRmultilayerscattering factorsself-absorption effects

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