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Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on

Wen Bin Li1, Xiao Yue Yang1, Jing Tao Zhu1

  • 1MOE Key Laboratory of Advanced Micro-structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092, People's Republic of China.

Journal of Synchrotron Radiation
|April 26, 2014
PubMed
Summary

A new method corrects self-absorption in fluorescence Extended X-ray Absorption Fine Structure (EXAFS) for multilayer samples. This technique accounts for interface effects, improving accuracy for various sample types.

Keywords:
EXAFSX-ray fluorescenceXRRmultilayerscattering factorsself-absorption effects

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Analytical Chemistry

Background:

  • Extended X-ray Absorption Fine Structure (EXAFS) is crucial for determining local atomic structure.
  • Self-absorption effects in fluorescence EXAFS can distort spectral data, especially in multilayer samples.
  • Existing correction methods may not fully account for complex interface phenomena like refraction and multiple reflections.

Purpose of the Study:

  • To develop and validate a novel correction method for self-absorption in fluorescence EXAFS.
  • To incorporate the effects of refraction and multiple reflections at interfaces into the correction.
  • To provide a versatile correction applicable to various multilayer and single-layer samples.

Main Methods:

  • A k-space correction method is proposed for self-absorption effects.
  • The method fully considers refraction and multiple reflection effects at interfaces.
  • The correction is applied prior to further data analysis.

Main Results:

  • The proposed method effectively corrects self-absorption in fluorescence EXAFS.
  • The correction is applicable to both single-layer and multilayer samples with flat surfaces.
  • The method demonstrates validity across different experimental geometries using Cr/C multilayer data.

Conclusions:

  • The novel correction method enhances the accuracy of fluorescence EXAFS analysis for multilayer systems.
  • This approach offers a robust tool for materials characterization without thickness limitations.
  • The technique improves the reliability of structural information derived from EXAFS measurements.