Energy dissipation in multifrequency atomic force microscopy

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Valentina Pukhova1, Francesco Banfi2, Gabriele Ferrini2

  • 1Dipartimento di Fisica, Università degli Studi di Milano, I-20122 Milano, Italy ; Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy.

Beilstein Journal of Nanotechnology
|April 30, 2014
PubMed

Keywords:
band excitationmultifrequency atomic force microscopy (AFM)phase referencewavelet transforms

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