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Analysis of higher harmonic contamination with a modified approach using a grating analyser
Rajkumar Gupta1, Mohammed H Modi1, M Kumar2
1X-ray Optics Section, Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India.
The Review of Scientific Instruments
|May 3, 2014
Summary
A new method accurately quantifies harmonic contamination in soft x-ray spectra from toroidal grating monochromators (TGMs). This analysis is crucial for precise measurements in synchrotron radiation applications.
Area of Science:
- Physics
- Synchrotron Radiation Science
- Spectroscopy
Background:
- Toroidal grating monochromators (TGMs) are essential for generating monochromatic soft x-ray beams.
- Accurate quantification of higher harmonic contributions is critical for spectral purity.
- Conventional methods for estimating harmonic contamination can be inaccurate due to overlapping diffraction orders.
Purpose of the Study:
- To develop and validate a modified approach for calculating harmonic contamination in TGM soft x-ray spectra.
- To accurately quantify harmonic content in the 50-360 Å wavelength range.
- To assess the impact of harmonic contamination on spectral analysis and filter characterization.
Main Methods:
- Analysis of soft x-ray spectra from the Indus-1 synchrotron source TGM.
- Utilizing a 1200 l/mm diffraction grating for spectral dispersion.
- Implementing a modified method to subtract overlapping higher-order contributions from the first-order peak.
Main Results:
- Harmonic contamination is <15% in the 90-180 Å range and increases to 6%-60% between 150-260 Å.
- Harmonic contamination is significantly low below 90 Å due to the Indus-1 critical wavelength of 61 Å.
- The modified method's results align well with multilayer reflectivity data analysis.
Conclusions:
- The proposed modified approach provides accurate harmonic contamination assessment for TGM spectra.
- Understanding harmonic content is vital for precise spectral analysis and applications like filter transmission fitting.
- The study contributes to improved data reliability in soft x-ray spectroscopy.
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