Analysis of higher harmonic contamination with a modified approach using a grating analyser

Rajkumar Gupta1, Mohammed H Modi1, M Kumar2

  • 1X-ray Optics Section, Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013, India.

Summary

A new method accurately quantifies harmonic contamination in soft x-ray spectra from toroidal grating monochromators (TGMs). This analysis is crucial for precise measurements in synchrotron radiation applications.