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A seamless acquisition digital storage oscilloscope with three-dimensional waveform display.

Kuojun Yang¹, Shulin Tian¹, Hao Zeng¹

¹School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China.

The Review of Scientific Instruments

|May 3, 2014

Summary

This study introduces a novel digital storage oscilloscope (DSO) that eliminates "dead time" by using a seamless acquisition method. This innovation allows for continuous signal capture and analysis, significantly improving the detection of infrequent events.

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Area of Science:

Electrical Engineering
Instrumentation and Measurement

Background:

Traditional digital storage oscilloscopes (DSOs) suffer from "dead time" where data processing halts signal acquisition.
This dead time leads to the loss of critical signal information, especially for infrequent events.

Purpose of the Study:

To propose and demonstrate a seamless acquisition oscilloscope that eliminates dead time.
To improve the capture of occasional, significant events in electronic systems.

Main Methods:

Developed a three-dimensional waveform mapping (TWM) technique for faster data processing and probability visualization.
Implemented parallel TWM and dual-port random access memory (RAM) pipelining for enhanced processing speed.
Utilized DDR3 (Double-Data-Rate Three Synchronous Dynamic Random Access Memory) for alternate data storage, enabling continuous acquisition during processing.

Main Results:

Achieved a waveform capturing rate (WCR) of 6,250,000 waveforms per second, the highest reported for existing oscilloscopes.
Demonstrated complete elimination of dead time, enabling seamless signal acquisition.
Verified the oscilloscope's capture ability through double-pulse and combined pulse testing methods.

Conclusions:

The designed oscilloscope successfully eliminates dead time, realizing seamless acquisition.
The novel techniques significantly enhance processing speed and waveform visualization.
This advancement is crucial for capturing critical infrequent events in modern electronic systems.