Note: switching crosstalk on and off in Kelvin Probe Force Microscopy

Area of Science:

• Surface science
• Microscopy techniques
• Scanning probe microscopy

Background:

• Electronic crosstalk is a known issue in Kelvin Probe Force Microscopy (KPFM), affecting measurement accuracy.
• This interference can occur between the excitation signal and the probe deflection signal, complicating data interpretation.

Purpose of the Study:

• To demonstrate a simple instrument modification for controlling electronic crosstalk in KPFM.
• To investigate the impact of crosstalk on open-loop KPFM measurements.
• To compare open-loop and closed-loop KPFM performance under crosstalk conditions.

Main Methods:

• A commercial KPFM instrument was modified to enable switching crosstalk on and off.
• Open-loop and closed-loop KPFM measurements were performed.
• The pure crosstalk signal was measured and quantified.
• Data processing techniques were developed to correct for crosstalk in open-loop KPFM.

Main Results:

• A straightforward modification allows for the controlled introduction and removal of electronic crosstalk.
• Open-loop KPFM measurements are significantly affected by crosstalk.
• The pure crosstalk signal can be accurately measured.
• Corrected open-loop KPFM results are independent of excitation signal parameters (frequency, amplitude).

Conclusions:

• The developed method effectively controls and allows for the elimination of electronic crosstalk in KPFM.
• Accurate open-loop KPFM measurements are achievable once crosstalk is corrected.
• This technique enhances the reliability and precision of KPFM surface potential measurements.